本週邀請到國立中正大學資訊工程系，林迺衛教授前來演講。講題與摘要如下：

Title:

Constraint-Based Test Case Generation for Black-Box Method-Level Unit Testing

Abstract:

This talk introduces a constraint-based approach to automatic generation of test cases for black-box method-level unit testing. The problem of automatic generation of test cases is formulated as finding an effective set of solutions to a constraint satisfaction problem (CSP = ). The variables V are the input and output of the method (or function) under test. The domains D are the types of the variables. The constraints C are the specification of the behaviors of the method. The specification of the behaviors of the method is described using the Universal Modeling Language class diagrams and the Object Constraint Language. Each solution to the CSP is a particular behavior of the method.

Finding an effective set of solutions to the CSP can be carried out in three steps. First, the behaviors of the method are partitioned into equivalence classes of behaviors. Second, a test coverage criterion is provided to constraint the number of equivalence classes. These two steps can be carried out based on constraint logic graphs (CLG). A CLG can be viewed as a succinct graphical representation of the disjunctive normal form (DNF) of the specification. Each complete path in the CLG corresponds to a conjunctive clause in the DNF and corresponds to a test case. The determination of the input and output for this test case is formulated as a CSP and expressed in constraint logic programming (CLP) predicates. CLP provides a powerful constraint solving capability and can solve the input and output simultaneously.

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